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Quicker Time to Yield; Increase Cycles of Learning to Impact Manufacturing Metrics

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Time: 08:32

In This Podcast

Listen to how Intel, Freescale Semiconductor and Western Digital are able to:

  • Reduce problem isolation and resolution cycle time from weeks to hours
  • Drive an estimated 1% GPM annual improvement
  • Save over $50M /year in product and allocated cost
  • Reduce IT OPEX costs of greater than $22M
 
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About the Presenters

Presenter

Paul Dennies, International Program Director for Global Industry Solutions, Teradata Corporation

Paul is currently responsible for developing a practice for test data management and engineering data access. Paul has over 20 years experience in semiconductor Device Engineering and Process Development. He joined Teradata in 2007 from Syntricity Corporation, a web-based decision support and integrated warehouse software solution for semiconductor manufacturing. 

Presenter

Mike Downer, Industry Consultant for hi tech manufacturing, Teradata Corporation

Prior to joining Teradata, Mike spent 22 years in semiconductor manufacturing in product & test engineering and manufacturing operations. Mike worked at Western Digital, Silicon Systems, Texas Instruments and Northrop Grumman. As a Teradata industry consultant, Mike focuses on integrated data analysis solutions for high tech manufacturers, primarily in the area of supply chain execution and engineering analytics around yield, quality and reliability.

 
 

Next Steps

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Vision of Efficiency: Freescale Semiconductor’s Diamond Project aims to provide a one-stop shop for analysis

Learn how Freescale’s EDW provides end-to-end analysis for all of the data, whether it's business or manufacturing to boost the company's performance and operational efficiency.

Learn More

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